Characterization 





 

Plasma deposited or treated materials are characterized by several analytical techniques and microscopies.
 

PTLUP is equipped with:

High End Scanning Probe Microscope and
Contact angle goniometer and surface analyzer


while it has also regular access to several analytical instruments and microscopes

- UV and Visible Raman Spectrometer
- Fourier Transform IR Spectrometer
- X-ray Photoelectron Spectrometer
- X-ray Diffraction Spectrometer
- Scanning Electron Microscope.
 
 


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