Characterization
Home People Publications Facilities Research Projects Plasma Diagnostics Plasma Modelling Characterization Links News & Jobs

 

Home
SPM
Goniometer
Other techniques

 

 

 


SPM Goniometer Other techniques

Plasma deposited or treated materials are characterized by several analytical techniques and microscopies:

Ptlup is equipped with:

bullet

High End Scanning Probe Microscope and

bullet

Contact angle goniometer and surface analyzer

while it has also regular access to several analytical instruments and microscopes

 
bullet

UV and Visible Raman Spectrometer

bullet

Fourier Transform IR Spectrometer

bullet

X-ray Photoelectron Spectrometer

bullet

X-ray Diffraction Spectrometer

bullet

Scanning Electron Microscope